WSXM:: A software for scanning probe microscopy and a tool for nanotechnology
WSXM:: A software for scanning probe microscopy and a tool for nanotechnology
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DOI:
10.1063/1.2432410
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发表时间:
2007-01-01
影响因子:
1.6
通讯作者:
Baro, A. M.
中科院分区:
文献类型:
--
作者:
Horcas, I.;Fernandez, R.;Baro, A. M.
In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out. (c) 2007 American Institute of Physics.