Scanning nonlinear dielectric microscope
Scanning nonlinear dielectric microscope
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DOI：
10.1063/1.1146936
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发表时间：
1996-06-01
影响因子：
1.6
通讯作者：
Saeki, T
中科院分区：
文献类型：
--
作者：
Cho, YS;Kirihara, A;Saeki, T
本文描述了一种新的扫描技术，通过测量铁电材料的非线性介电常数的点到点的微观变化来成像铁电材料的自发极化状态。首先，介绍了偏振检测的基本原理。其次，介绍了非线性介电响应的测量技术。最后，利用该显微镜对极化锆钛酸铅陶瓷、铌酸锂单晶和偏氟乙烯-三氟乙烯共聚物压电薄膜的极化进行了面扫描。(C)1996年美国物理研究所。
This article describes a new scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic point-to-point variation of its nonlinear dielectric constants. First, the theory for detecting polarization is described. Second, the technique for measuring the nonlinear dielectric response is described. Finally, using this new microscope, area scans are obtained of the polarization of poled lead zirconate titanate ceramics, a lithium niobate single crystal, and of piezoelectric thin films of the copolymer of vinylidene fluoride and trifluoroethylene. (C) 1996 American Institute of Physics.