Recombination: An important effect in multigap resistive plate chambers
Recombination: An important effect in multigap resistive plate chambers
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复合：多间隙电阻板室的重要影响
DOI：
10.1016/j.nima.2009.09.055
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发表时间：
2009
影响因子：
1.4
通讯作者：
A. Zichichi
中科院分区：
文献类型：
--
作者：
K. Doroud;H. Afarideh;D. Hatzifotiadou;J. Rahighi;M. Williams;A. Zichichi
我们模拟了多间隙电阻板室（MRPC）中的气体雪崩。然后将结果与我们的MRPC数据进行比较[1]。到目前为止，在气隙中产生的电荷总量被认为是由气体雪崩产生的正离子的总数给出的。然而，模拟程序产生的总电荷太大，与我们的数据相冲突。我们的数据表明，几乎100%的负离子与正离子复合。复合效应显著减少了气隙中的电荷量：这是MRPC技术的一个非常重要的特征，特别是对于速率能力。
We have simulated the gas avalanche in a multigap resistive plate chamber (MRPC). The results were then compared with our data from the MRPC [1]. Up to now, the total amount of charge produced in a gas gap is considered to be given by the total number of positive ions generated by the gas avalanches. However, the total charge generated by the simulation program is much too large and is in conflict with our data. Our data indicate that nearly 100% of the negative ions recombine with the positive ions. The recombination effect dramatically reduces the amount of charge in the gas gap: a very important feature for MRPC technology especially for the rate capability.