Design and validation of a platform for electromagnetic fault injection

Design and validation of a platform for electromagnetic fault injection
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电磁故障注入平台的设计与验证

DOI:
10.1109/dcis.2017.8311630
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发表时间:
2017
期刊:
2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS)
影响因子:
--
通讯作者:
S. Manich
S. Manich
中科院分区:
--
文献类型:
--
作者:
J. Balasch;D. Arumí;S. Manich

文献摘要

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安全性被认为是嵌入式电路设计和部署的主要挑战之一。设备需要在现场安全、正确地运行,即使是在潜在对手的物理范围内。损害设备正确功能的最强大技术之一是故障注入攻击。它们使主动对手能够触发电路上的错误,以绕过安全功能或获取安全敏感信息。有多种方法可以引发此类错误。在这项工作中,我们重点关注通过电磁 (EM) 通道注入故障。我们特别记录了我们为构建合适的电磁脉冲注入平台所做的努力。我们设计了一种脉冲注入电路,可以向电磁注入器提供超过 20 A 的电流,以便在电路附近产生电磁场的突变。我们通过对实现 AES 块密码的嵌入式 8 位微控制器应用众所周知的攻击来验证我们平台的适用性。特别是,我们展示了如何通过在加密操作期间仔细注入错误以及对错误输出进行简单分析来提取存储在设备中的 AES 秘密加密密钥。
Security is acknowledged as one of the main challenges in the design and deployment of embedded circuits. Devices need to operate on-the-field safely and correctly, even when at physical reach of potential adversaries. One of the most powerful techniques to compromise the correct functioning of a device are fault injection attacks. They enable an active adversary to trigger errors on a circuit in order to bypass security features or to gain knowledge of security-sensitive information. There are several methods to induce such errors. In this work we focus on the injection of faults through the electromagnetic (EM) channel. In particular, we document our efforts towards building a suitable platform for EM pulse injection. We design a pulse injection circuit that can provide currents over 20 A to an EM injector in order to generate abrupt variations of the EM field on the vicinity of a circuit. We validate the suitability of our platform by applying a well-know attack on an embedded 8-bit microcontroller implementing the AES block cipher. In particular, we show how to extract the AES secret cryptographic keys stored in the device by careful injection of faults during the encryption operations and simple analysis of the erroneous outputs.