Temperature-dependence of the electronic structure of La1-xSrxMnO3 thin films studied by in situ photoemission spectroscopy

Temperature-dependence of the electronic structure of La1-xSrxMnO3 thin films studied by in situ photoemission spectroscopy
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原位光电子能谱研究 La1-xSrxMnO3 薄膜电子结构的温度依赖性

DOI:
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发表时间:
2007
期刊:
J. Elec. Spect. Rel. Phenom 156-158
影响因子:
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通讯作者:
H. Koinuma
H. Koinuma
中科院分区:
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文献类型:
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作者:
K. Horiba;A. Chikamatsu;H. Kumigashira;M. Oshima;A. Fujimori;M. Lippmaa;M. Kawasaki;H. Koinuma

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