Locating a Faulty Interaction in Pair-wise Testing

Locating a Faulty Interaction in Pair-wise Testing
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DOI:
10.1109/prdc.2014.26
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发表时间:
2014-11
期刊:
2014 IEEE 20th Pacific Rim International Symposium on Dependable Computing
影响因子:
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通讯作者:
Takahiro Nagamoto;Hideharu Kojima;Hiroyuki Nakagawa;Tatsuhiro Tsuchiya
Takahiro Nagamoto;Hideharu Kojima;Hiroyuki Nakagawa;Tatsuhiro Tsuchiya
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文献类型:
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作者:
Takahiro Nagamoto;Hideharu Kojima;Hiroyuki Nakagawa;Tatsuhiro Tsuchiya

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本文讨论了软件测试中错误交互的位置。我们提出了一种算法来生成测试用例集,该测试用例集可以用于识别错误的成对交互。这种方法的工作原理如下。首先,使用现有的成对测试方法生成测试套件。成对测试需要测试所有成对交互作用,但不能保证错误交互作用可以被定位。其次,列举了测试套件无法定位的成对交互。最后,将测试用例重复添加到测试套件中,直到可以定位所有成对交互。将该算法应用于多个问题实例的测试结果表明,使用该算法得到的测试集几乎是普通成对测试的两倍,这并不能保证故障定位能力。
This article discusses the location of faulty interactions in software testing. We propose an algorithm to generate a test suite that can be used to identify a faulty pair-wise interaction. This approach works as follows. First, a test suite is generated using an existing method for pair-wise testing. Pair-wise testing requires testing all pair-wise interactions but does not guarantee that the faulty interaction can be located. Second, pair-wise interactions that cannot be located by the test suite are enumerated. Finally, test cases are repeatedly added to the test suite until all pair-wise interactions can be located. The results of applying the algorithm to several problem instances show that the test suites obtained using the algorithm are nearly twice as large as those for ordinary pair-wise testing which does not ensure fault locating ability.