First-Principles Study of Structural Stabilities, Electronic and Optical Properties of SrF2 under High Pressure
First-Principles Study of Structural Stabilities, Electronic and Optical Properties of SrF2 under High Pressure
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高压下SrF2结构稳定性、电子和光学性能的第一性原理研究
DOI:
10.1088/0256-307x/26/7/077103
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发表时间:
2009-07
影响因子:
3.5
通讯作者:
Liu Ri-Ping
中科院分区:
文献类型:
--
作者:
Li Jie;Zhang Su-Hong;Yang Xiao-Cui;Zhang Xin-Yu;Xin Wei;Hao Ai-Min;Liu Ri-Ping
An investigation of structural stabilities, electronic and optical properties of SrF2 under high pressure is conducted using a first-principles calculation based on density functional theory (DFT) with the plane wave basis set as implemented in the CASTEP code. Our results predict that the second high-pressure phase of SrF2 is of a Ni2In-type structure, and demonstrate that the sequence of the pressure-induced phase transition of SrF2 is the fluorite structure (Fm3m) to the PbCl2-type structure (Pnma), and to the Ni2In-type phase (P63/mmc). The first and second phase transition pressures are 5.77 and 45.58 GPa, respectively. The energy gap increases initially with pressure in the Fm3m, and begins to decrease in the Pnma phases at 30 GPa. The band gap overlap metallization does not occur up to 210 GPa. The pressure effect on the optical properties is discussed.
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影响因子:
3.5
作者:
Xin-yu Zhang;Zhou-Wen Chen;Yan-Peng Qi;Feng Yan;Zhaopeng Liang;Qi Li;Ming-zhen Ma;Ri-Ping Liu;Wen-Kui Wang
通讯作者:
Xin-yu Zhang;Zhou-Wen Chen;Yan-Peng Qi;Feng Yan;Zhaopeng Liang;Qi Li;Ming-zhen Ma;Ri-Ping Liu;Wen-Kui Wang
影响因子:
3.7
作者:
LEGER, JM;HAINES, J;HULL, S
通讯作者:
HULL, S
影响因子:
3.5
作者:
Guo Xiao-ju;Xu Bo;Liu Zhongyuan;Yu Dong-li;He Ju-long;Guo Li-Cong
通讯作者:
Guo Xiao-ju;Xu Bo;Liu Zhongyuan;Yu Dong-li;He Ju-long;Guo Li-Cong
DOI:
10.1103/physrevb.50.12318
发表时间:
1994-11
期刊:
Physical review. B, Condensed matter
影响因子:
--
作者:
G. Kalpana;B. Palanivel;M. Rajagopalan
通讯作者:
G. Kalpana;B. Palanivel;M. Rajagopalan
影响因子:
2.8
作者:
M. Mérawa;Miquel Llunell;R. Orlando;M. Gelizé-Duvignau;R. Dovesi
通讯作者:
M. Mérawa;Miquel Llunell;R. Orlando;M. Gelizé-Duvignau;R. Dovesi