Quantitative micromagnetics: electron holography of magnetic thin films and multilayers
Quantitative micromagnetics: electron holography of magnetic thin films and multilayers
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定量微磁学：磁性薄膜和多层的电子全息术
DOI：
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发表时间：
1996
期刊：
影响因子：
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通讯作者：
J. M. Cowley
中科院分区：
文献类型：
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作者：
M. Mankos;M. Scheinfein;J. M. Cowley
利用扫描透射电子显微镜（STEM）的离轴电子全息技术，提出了一种纳米空间分辨率下磁性材料磁性微观结构绝对测量的新方法。全息模式允许定量测量磁感应强度和磁化强度，确定磁畴中的等磁化线，并直接确定磁畴壁和磁通涡剖面。STEM全息技术伴随着传统技术已被应用于磁性薄膜、磁性多层结构和小磁性颗粒的表征。这种结合微磁分析技术的仪器为研究磁性材料的磁微观结构和微观结构提供了一种有价值的工具，具有高灵敏度（/spl sim/10/sup -15/ emu）和纳米空间分辨率。
A new method for the absolute measurement of magnetic microstructure at nanometer spatial resolution in magnetic materials has been developed by implementing off-axis electron holography in a scanning transmission electron microscope (STEM). The holography modes permit quantitative measurement of magnetic induction and magnetization, the determination of equimagnetization lines in domains and straightforward determination of domain wall and flux vortex profiles. STEM holography accompanied by the conventional techniques has been applied to the characterisation of thin magnetic films, magnetic multilayer structures and small magnetic particles. This combination of micromagnetic analysis techniques in one instrument provides a valuable tool for the investigation of magnetic microstructure and microscopic structure in magnetic materials with high sensitivity (/spl sim/10/sup -15/ emu) and at nm spatial resolution.