Measurement of delay mismatch due to process variations by means of modified ring oscillators
Measurement of delay mismatch due to process variations by means of modified ring oscillators
复制标题
通过改进的环形振荡器测量由于工艺变化引起的延迟失配
DOI：
10.1109/iscas.2005.1465818
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发表时间：
2005
期刊：
影响因子：
--
通讯作者：
A. Khouas
中科院分区：
文献类型：
--
作者：
Bo Zhou;A. Khouas
提出了一种新颖有效的测试电路，用于测量由于工艺变化引起的单元间延迟失配。还描述了有效实现该技术的全数字控制电路。建议的测试结构是实现了一系列修改的环形振荡器，最大限度地减少不准确的因素。使用0.18 /spl μ/mCMOS工艺的模拟结果表明，该技术的可行性。这种测试结构可以有利于彻底表征芯片内部系统工艺变化的影响。
A novel and effective test circuit to measure cell-to-cell delay mismatch due to process variations is presented. A fully digital control circuit that efficiently realizes the technique is also described. The proposed test structure is realized by a series of modified ring oscillators that minimize factors of inaccuracy. The results of a simulation using 0.18 /spl mu/m CMOS technology show the feasibility of the technique. This test structure can be beneficial in thoroughly characterizing the effects of systematical process variations inside the chip.