X-ray CCD calibration for the AXAF CCD Imaging Spectrometer
X-ray CCD calibration for the AXAF CCD Imaging Spectrometer
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AXAF CCD 成像光谱仪的 X 射线 CCD 校准
DOI：
10.1117/12.331238
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发表时间：
1996
期刊：
影响因子：
--
通讯作者：
G. Ulm
中科院分区：
文献类型：
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作者：
M. Bautz;M. Pivovaroff;F. Baganoff;T. Isobe;Stephen E. Jones;S. Kissel;B. LaMarr;H. L. Manning;G. Prigozhin;G. Ricker;J. Nousek;C. Grant;K. Nishikida;F. Scholze;R. Thornagel;G. Ulm
AXAF CCD成像光谱仪是美国宇航局先进X射线天体物理设施上的两台焦平面仪器之一，其地面校准数据的获取工作于1997年完成。在这里，我们总结探测器水平校准工作的结果。我们的校准计划包括测量CCD对未分散的同步辐射的响应，测量X射线吸收精细结构，以及探测器中的亚像素结构。能量刻度的误差在千分之几个百分点的水平上，而探测效率误差不大于几个百分点。我们还对电荷耦合器件的门结构和沟道阻挡对电荷耦合器件光谱重分布函数的影响机制有了新的认识。
Acquisition of ground calibration data from the AXAF CCD Imaging Spectrometer, one of two focal plane instruments on NASA's Advanced X-ray Astrophysics Facility, was completed in 1997. Here we summarize results of the detector level calibration effort. Our calibration program has included measurements of CCD response to undispersed synchrotron radiation, measurements of x-ray absorption fine structure, and of sub-pixel structure in the detector. Errors in the energy scale are at the level of a few tenths of one percent, and detection efficiency errors are no large than a few percent. We have also obtained new insights into the mechanisms by which the CCD gate structure and channel stops influence the CCD spectral redistribution function.