Development of a fast calibration method for image mapping spectrometry.
Development of a fast calibration method for image mapping spectrometry.
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DOI：
10.1364/ao.395988
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发表时间：
2020-07
期刊：
影响因子：
1.9
通讯作者：
Qi Cui;Jongchan Park;Rishyashring R. Iyer;Mantas Žurauskas;S. Boppart;R. T. Smith;Liang Gao
中科院分区：
文献类型：
--
作者：
Qi Cui;Jongchan Park;Rishyashring R. Iyer;Mantas Žurauskas;S. Boppart;R. T. Smith;Liang Gao
图像映射光谱仪（IMS）是一种快照高光谱成像仪，可以同时捕获入射光的空间（x, y）和光谱（λ）信息。IMS将三维（3D）数据立方体（x, y, λ）映射到二维（2D）探测器阵列（x, y）以进行平行测量。要重建原始3D数据立方体，必须构造一个查找表，将数据立方体中的体素和原始图像中的像素连接起来。以往的校准方法要么速度低，要么图像质量差。本文提出了一种狭缝扫描校准方法，可以在保持高精度的同时显著减少校准时间。此外，我们还定量分析了IMS中的主要伪影——条纹图像，并开发了三种数值校正方法。
An image mapping spectrometer (IMS) is a snapshot hyperspectral imager that simultaneously captures both the spatial (x, y) and spectral (λ) information of incoming light. The IMS maps a three-dimensional (3D) datacube (x, y, λ) to a two-dimensional (2D) detector array (x, y) for parallel measurement. To reconstruct the original 3D datacube, one must construct a lookup table that connects voxels in the datacube and pixels in the raw image. Previous calibration methods suffer from either low speed or poor image quality. We herein present a slit-scan calibration method that can significantly reduce the calibration time while maintaining high accuracy. Moreover, we quantitatively analyzed the major artifact in the IMS, the striped image, and developed three numerical methods to correct for it.