Real-time ellipsometric characterization of the initial growth stage of poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) films by electrospray deposition using N,N-dimethylformamide solvent solution
Real-time ellipsometric characterization of the initial growth stage of poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) films by electrospray deposition using N,N-dimethylformamide solvent solution
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使用 N,N-二甲基甲酰胺溶剂溶液通过电喷雾沉积对聚（3,4-乙撑二氧噻吩）：聚（苯乙烯磺酸）薄膜的初始生长阶段进行实时椭圆测量表征
DOI：
10.1143/jjap.51.061602
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
and H. Shirai
中科院分区：
文献类型：
--
作者：
T. Ino;T. Hiate;T. Fukuda;K. Ueno;and H. Shirai
利用椭圆偏振光谱（SE）实时表征了用于晶体硅/有机杂化异质结太阳能电池的聚（3-己基噻吩）（P3HT）薄膜在晶体硅（c-Si）晶片上的电喷雾沉积（ESD）。相对于旋转镀膜的不均匀沉积，通过调整沉积条件，P3HT薄膜在平面和有织构的c-Si晶片上实现了均匀沉积。在P3HT上沉积导电聚（3,4 -乙烯二氧噻吩）：聚（苯乙烯磺酸盐）（PEDOT: PSS）也得到了类似的结果。c-Si/P3HT/PEDOT: PSS异质结太阳能电池在平面和纹理c-Si晶片上的效率分别为4.1%和6.3%。这些发现表明，静电放电是一种在平面和纹理疏水基底上均匀沉积P3HT和PEDOT: PSS薄膜的有前途的方法。
The electrospray deposition (ESD) of poly (3-hexylthiophene)(P3HT) films for use in crystalline silicon/organic hybrid heterojunction solar cells on a crystalline silicon (c-Si) wafer was investigated using real-time characterization by spectroscopic ellipsometry (SE). In contrast to the nonuniform deposition of products frequently obtained by spin-coating, a uniform deposition of P3HT films was achieved on flat and textured hydrophobic c-Si wafers by adjusting the deposition conditions. Similar findings were also obtained for the deposition of conductive poly (3, 4-ethylenedioxythiophene): poly (styrene sulfonate)(PEDOT: PSS) on P3HT. The c-Si/P3HT/PEDOT: PSS heterojunction solar cells exhibited efficiencies of 4.1 and 6.3% on flat and textured c-Si wafers, respectively. These findings suggest that ESD is a promising method for the uniform deposition of P3HT and PEDOT: PSS films on flat and textured hydrophobic substrates.