Time‐of‐flight secondary‐ion mass spectrometry for the surface characterization of solid‐state pharmaceuticals
Time‐of‐flight secondary‐ion mass spectrometry for the surface characterization of solid‐state pharmaceuticals
复制标题
用于固态药物表面表征的飞行时间二次离子质谱法
DOI：
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发表时间：
2007
期刊：
影响因子：
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通讯作者：
W. Skinner
中科院分区：
文献类型：
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作者：
C. Prestidge;T. Barnes;W. Skinner
Time‐of‐flight secondary‐ion mass spectrometry (ToF‐SIMS) is a highly surface sensitive analytical method for surface chemical identification and surface chemical distribution analysis (mapping). Here we have explored the application of ToF‐SIMS for the characterization of solid‐state pharmaceuticals and highlight specific case studies concerning the distribution and stability of pharmaceutical actives within solid matrices (pellets and polymeric carriers) and the face‐specific properties of pharmaceutical crystals.
