Crystallographic heterodyne phase detection for highly sensitive lattice-distortion measurements
Crystallographic heterodyne phase detection for highly sensitive lattice-distortion measurements
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DOI：
10.1364/josaa.13.001495
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发表时间：
1996-07
影响因子：
1.9
通讯作者：
M. Takeda;J. Suzuki
中科院分区：
文献类型：
--
作者：
M. Takeda;J. Suzuki
注意到晶体中的扭曲晶格与光学计量中的空间相位调制条纹图案之间的结构相似性，我们提出了晶体晶格外差技术。该技术将晶格畸变检测为空间相位调制，其中 2π 的相位变化对应于原子或晶格点位移等于晶格常数的距离。凭借外差检测，该技术有可能确定晶格常数的百分之几的晶格畸变。
Noting the structural similarity between a distorted lattice in a crystal and a spatially phase-modulated fringe pattern in optical metrology, we propose a crystallographic lattice heterodyne technique. The technique detects lattice distortions as spatial phase modulations, where the phase change by 2π corresponds to the displacement of atoms or lattice points by a distance equal to the lattice constant. By virtue of heterodyne detection, the technique has the potential for determining the lattice distortions to several hundredths of the lattice constant.