A phase-sampling method for an X-ray Talbot-Lau scanner with continuous grating movement

A phase-sampling method for an X-ray Talbot-Lau scanner with continuous grating movement
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DOI:
10.1088/1748-0221/15/01/p01010
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发表时间:
2020-01-01
影响因子:
1.3
通讯作者:
Anton, G.
Anton, G.
中科院分区:
工程技术4区
文献类型:
--
作者:
Ludwig, V.;Akstaller, B.;Anton, G.

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Talbot-Lau扫描仪可实现大样本的快速光栅X射线相衬和暗场成像。我们提出了一种快速和强大的扫描方法的基础上,在通常的扫描过程中连续相位采样。为此目的,源光栅在整个图像采集过程期间来回移动。扫描方法不需要干涉仪的特定失谐。将所获取的图像与标准相位步进程序的结果进行比较。我们表明,高品质的图像,通过这种连续相位采样扫描方法。该方法的一个主要优点是其独立于出现的莫尔图案形状,从而能够实现干涉仪的最佳对准。此外,该方法与先验未知的相位步长位置。据我们所知,这是第一次在Talbot-Lau成像中连续图像采集期间,光栅连续来回移动,同时样品也处于线性运动中。
A Talbot-Lau scanner enables fast grating-based X-ray phase-contrast and dark-field imaging of large samples. We present a fast and robust scanning method based on continuous phase-sampling during the usual scan process. For that purpose the source grating is moved back and forth during the whole image acquisition procedure. The scanning method needs no specific detuning of the interferometer. The acquired images are compared to the results of a standard phase-stepping procedure. We show that high quality images are obtained by this continuous phase-sampling scanning method. One main advantage of the method is its independence of the occurring moire pattern shape, thus enabling an optimal alignment of the interferometer. Furthermore, the method works with a priori unknown phase-step positions. To our knowledge, this is the first time a grating is moved continuously back and forth while also the sample is in linear motion during a continuous image acquisition in Talbot-Lau imaging.