Importance of interface roughness induced intersubband scattering in mid-infrared quantum cascade lasers

Importance of interface roughness induced intersubband scattering in mid-infrared quantum cascade lasers
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中红外量子级联激光器中界面粗糙度引起的子带间散射的重要性

DOI:
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发表时间:
2012
期刊:
影响因子:
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通讯作者:
C. Gmachl
C. Gmachl
中科院分区:
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文献类型:
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作者:
Yenting Chiu;Y. Dikmelik;Peter Q. Liu;N. Aung;J. Khurgin;C. Gmachl

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许多不同的量子级联激光器的电子渡越时间已被测量和计算的上激光能级寿命与不考虑界面粗糙度引起的子带间散射进行了比较。当包括来自界面粗糙度的贡献时,在实验结果和计算之间发现显著更好的相关性(相关系数:0.79与0.43相比,分别考虑和不考虑界面粗糙度)。这表明,除了纵向光学声子,界面粗糙度也是至关重要的,在确定子带间的寿命中红外量子级联激光器,并应定期包括在设计中。
The electron transit time of many different quantum cascade lasers has been measured and compared to the calculated upper laser level lifetimes with and without taking into account interface roughness induced intersubband scattering. A significantly better correlation is found between the experimental results and the calculation when including the contribution from the interface roughness (corr. coeff.: 0.79 vs. 0.43 with and without the consideration of interface roughness, respectively). This suggests that in addition to longitudinal optical phonons, interface roughness is also crucial in determining the intersubband lifetimes in mid-infrared quantum cascade laser and should routinely be included in design.