NEAR-FIELD SCANNING OPTICAL MICROSCOPE WITH A METALLIC PROBE TIP
NEAR-FIELD SCANNING OPTICAL MICROSCOPE WITH A METALLIC PROBE TIP
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DOI：
10.1364/ol.19.000159
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发表时间：
1994-02-01
期刊：
影响因子：
3.6
通讯作者：
KAWATA, S
中科院分区：
文献类型：
--
作者：
INOUYE, Y;KAWATA, S
研制了一种金属探针头近场扫描光学显微镜，用于检测样品精细结构表面附近的局域光子。在该显微镜中，金属探针用于将定位于样品表面附近的倏逝光子转换为传播的散射光波；用外置聚光器对远场散射光进行检测。在测量过程中，探针尖端在2.5 kHz的频率下以大约5 nm的振幅垂直于表面振动，并且以该频率调制的光强被锁定检测。这种操作可以消除杂散光噪声的影响。给出了在有和没有探头振动的情况下测量全内反射产生的倏逝场的指数衰减的实验结果。并给出了光盘表面轮廓的图像数据。
A near-field scanning optical microscope with a metallic probe tip was developed for detecting localized photons near the surface of the fine structure of a sample. In this microscope a metallic probe is used for converting the evanescent photons localized near the sample surface to the propagating scattering light wave; the scattered light is detected in the far field with external condenser optics. During the measurement the probe tip vibrates normal to the surface with an amplitude of approximately 5 nm at 2.5 kHz, and the light intensity modulated with this frequency is lock-in detected. This operation permits the removal of stray-light noise contribution. Experimental results of the measurements of the exponential decay of the evanescent field produced by total internal reflection are given with and without the probe vibration. Image data of the surface profile of an optical compact disk are also shown.