Arrayed silicon avalanche cathodes
Arrayed silicon avalanche cathodes
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DOI:
10.1109/55.62970
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发表时间:
1990
影响因子:
4.9
通讯作者:
J. Ea;B. Lalevic;D. Zhu;Y. Lu;R. Zeto
中科院分区:
文献类型:
--
作者:
J. Ea;B. Lalevic;D. Zhu;Y. Lu;R. Zeto
Silicon avalanche cathodes (SACs) consisting of a heavily doped shallow (less than 300 A) p-n junctions were fabricated, characterized, and used as electron sources in Si-based microvacuum diodes. The emission current was investigated as a function of diode reverse-biased voltage and external field. The field was provided by an anode placed approximately 1 mm above the cathode to simulate the field which would be obtained with a built-on-chip anode. Eighteen different shapes and sizes of SACs were tested. An emission current of 0.24 mu A and an emission efficiency (emission current/total diode current) of 2.1*10/sup -5/ were observed from the single bare Si p-n junction cold cathode.>