In situ characterization of ZnTe epilayer irradiation via time-resolved and power-density-dependent Raman spectroscopy

In situ characterization of ZnTe epilayer irradiation via time-resolved and power-density-dependent Raman spectroscopy
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DOI:
10.1088/0268-1242/26/10/105023
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发表时间:
2011-09
影响因子:
1.9
通讯作者:
V. Wiedemeier;G. Berth;A. Zrenner;E. M. Larramendi;U. Woggon;K. Lischka;D. Schikora
V. Wiedemeier;G. Berth;A. Zrenner;E. M. Larramendi;U. Woggon;K. Lischka;D. Schikora
中科院分区:
工程技术4区
文献类型:
--
作者:
V. Wiedemeier;G. Berth;A. Zrenner;E. M. Larramendi;U. Woggon;K. Lischka;D. Schikora

文献摘要

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用功率密度相关和时间分辨的显微拉曼光谱原位分析了激光辐照对外延层的损伤。随着激光功率密度的增加,样品表面的烧蚀损伤或复合分解损伤表现为ZnTe-NLO模强度的降低。在高于4.4×105W cmμ-−2的功率密度下,观察到了与较强的晶体碲模式、碲聚集体和室温下的二阶拉曼散射相关的峰的出现。激光辐照损伤的指数演化和晶体碲聚集体的快速形成。
Laser irradiation damage in ZnTe epilayers was analyzed in situ by power-density-dependent and time-resolved micro-Raman spectroscopy. Damage by ablation or compound decomposition on the sample surface was revealed by the decrease of the ZnTe–nLO mode intensity with the increase of laser power density. The appearance of the peaks associated with the stronger crystalline-tellurium modes, tellurium aggregates and second-order Raman scattering at room temperature μ-Raman spectra was observed for higher power densities than 4.4 × 105 W cm−2. The Raman signal time transients of ZnTe–nLO and crystalline-tellurium modes reveal an exponential evolution of the laser irradiation damage and a fast formation of crystalline tellurium aggregates on the layer surface.