High-Resolution Multislice X-Ray Ptychography of Extended Thick Objects
High-Resolution Multislice X-Ray Ptychography of Extended Thick Objects
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DOI：
10.1103/physrevlett.112.053903
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发表时间：
2014-02-04
影响因子：
8.6
通讯作者：
Takahashi, Yukio
中科院分区：
文献类型：
--
作者：
Suzuki, Akihiro;Furutaku, Shin;Takahashi, Yukio
我们报告的第一个演示的硬X射线重叠使用多层的方法，它可以解决有限的空间分辨率下的投影近似的问题。我们测量了一个两层的对象与105 μ m的间隙，使用7千电子伏聚焦相干X射线的ptychographic衍射图案。我们成功地重建了相位图的每一层在类似于50 nm的分辨率，使用多层的方法，而分辨率是差于类似于192 nm下的投影近似。本方法有可能使三维高分辨率观察材料科学和生物学中的扩展厚标本。
We report the first demonstration of hard x-ray ptychography using a multislice approach, which can solve the problem of the limited spatial resolution under the projection approximation. We measured ptychographic diffraction patterns of a two-layered object with a 105 mu m gap using 7 keV focused coherent x rays. We successfully reconstructed the phase map of each layer at similar to 50 nm resolution using a multislice approach, while the resolution was worse than similar to 192 nm under the projection approximation. The present method has the potential to enable the three-dimensional high-resolution observation of extended thick specimens in materials science and biology.