Spectroscopic ellipsometry study of CsPbBr3 perovskite thin films prepared by vacuum evaporation
Spectroscopic ellipsometry study of CsPbBr3 perovskite thin films prepared by vacuum evaporation
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DOI：
10.1088/1361-6463/abe821
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发表时间：
2021-06-03
影响因子：
3.4
通讯作者：
Duan, Yu
中科院分区：
文献类型：
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作者：
Chen, Chen;Wu, Dan;Duan, Yu
CsPbX 3（X = Cl、Br或I）钙钛矿薄膜可以通过真空蒸发（VE）以高再现性和良好的成膜能力来制备。为了设计基于CsPbX 3薄膜的光学器件，需要精确的光学常数。由于VE法制备的钙钛矿薄膜的光学和介电性能研究较少，本文对CsPbBr_3钙钛矿VE薄膜的复折射率和复介电函数进行了全面的研究。椭圆偏振光谱结合X射线衍射和扫描电子显微镜显示，三振子模型精确地描述了光学常数。因此，材料的波长相关光学常数可以凭经验确定。时间分辨的光致发光的设计CsPbBr 3-发光器件与法布里-珀罗腔和协议的介电性能与报道的数据证实了存在的微腔效应，并准确地预测了电场强度分布和腔长。这种方法还能够监测钙钛矿的组成，其中包含优化光学电子性能所需的部分。
CsPbX3 (X = Cl, Br, or I) perovskite thin films can be fabricated by vacuum evaporation (VE) with high reproducibility and good film-forming ability. To design optical devices based on CsPbX3 thin films, precise optical constants are required. As only a few optical and dielectric properties of perovskites obtained by VE have been reported, we have comprehensively studied the complex reflective index and complex dielectric function of CsPbBr3 perovskite VE films. Spectroscopic ellipsometry combined with x-ray diffraction and scanning electron microscopy revealed that the three-oscillator model precisely describes the optical constants. Therefore, the wavelength-dependent optical constants of a material can be empirically determined. Time-resolved photoluminescence of a designed CsPbBr3-light-emitting device with a Fabry-Perot cavity and agreement of its dielectric properties with reported data confirmed the existence of a microcavity effect and accurately predicted the electric field intensity distribution and cavity length. This methodology also enables the composition of perovskite to be monitored, which contains a fraction that is desirable for optimizing the performance of optical electronics.