Enhanced surface integrity and dimensional accuracy by simultaneous micro-ED/EC milling
Enhanced surface integrity and dimensional accuracy by simultaneous micro-ED/EC milling
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DOI：
10.1016/j.cirp.2012.03.011
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发表时间：
2012
影响因子：
4.1
通讯作者：
M. D. Nguyen;Mustafizur Rahman;Y. Wong
中科院分区：
文献类型：
--
作者：
M. D. Nguyen;Mustafizur Rahman;Y. Wong
