A New Test Procedure to Measure Power Electronic Devices’ Frequency Coupling Admittance
A New Test Procedure to Measure Power Electronic Devices’ Frequency Coupling Admittance
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DOI:
10.1109/tim.2018.2819318
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发表时间:
2018-04
影响因子:
5.6
通讯作者:
D. Gallo;R. Langella;M. Luiso;A. Testa;N. Watson
中科院分区:
文献类型:
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作者:
D. Gallo;R. Langella;M. Luiso;A. Testa;N. Watson
One method to model power electronic devices for harmonic emission studies is using frequency-domain models based on the frequency coupling matrices. This paper presents a new test procedure for the experimental evaluation of the frequency coupling matrix elements of power electronic devices. An automated test system is designed, realized, and characterized from a metrological perspective. Experimental tests show the tremendous increase in speed of the new test procedure in comparison to the classical test procedures present in the literature, with the same levels of accuracy of obtained results.