A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing
A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing
复制标题
近阈值计算中软错误、老化和过程变化的跨层分析
DOI：
10.3850/9783981537079_0270
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发表时间：
2016
期刊：
影响因子：
--
通讯作者：
M. Tahoori
中科院分区：
文献类型：
--
作者：
A. Gebregiorgis;S. Kiamehr;Fabian Oboril;R. Bishnoi;M. Tahoori
近阈值计算（NTC）是降低现代VLSI设计功耗的一种很有前途的方法。然而，NTC设计遭受功能故障和性能损失。了解功能故障和可变性影响的特征对于减轻它们并充分利用NTC具有决定性的重要性。本文提出了一种跨层可靠性分析的软错误，老化和工艺变化的影响，在近阈值电压域的存在。我们的目标是量化不同的SRAM设计的可靠性，并找到一个NTC微处理器的可靠性性能最佳的高速缓存组织。在这项工作中，软错误率（SER）和信号噪声容限（SNM）的6T和8T SRAM单元和它们对老化和工艺变化的依赖关系进行了研究，考虑器件，电路和架构级分析。他们的实验结果表明，在NTC中，工艺变化和老化引起的SNM退化比超阈值域高2.5倍，而SER高8倍。使用8T SRAM单元代替6T SRAM单元，可以使系统级SNM和SER分别降低14%和22%。此外，我们观察到，我们可以找到正确的性能和可靠性之间的平衡，通过使用一个适当的缓存组织在NTC这是不同的超阈值。
Near Threshold Computing (NTC) is a promising approach to reduce the power consumption of modern VLSI designs. However, NTC designs suffer from functional failures and performance loss. Understanding the characteristics of the functional failures and variability effects is of decisive importance in order to mitigate them, and get the most out of NTC. This paper presents a cross-layer reliability analysis in the presence of soft errors, aging and process variation effects in the near threshold voltage domain. The objective is to quantify the reliability of different SRAM designs and to find a reliability-performance optimal cache organization for an NTC microprocessor. In this work, the Soft Error Rate (SER) and Signal Noise Margin (SNM) of 6T and 8T SRAM cells and their dependencies on aging and process variation are investigated by considering device, circuit and architecture level analysis. Their experimental results reveal that in NTC, process variation and aging-induced SNM degradation is 2.5X higher than in the super threshold domain while SER is 8X higher. The use of 8T instead of 6T SRAM cells can reduce the system-level SNM and SER by 14% and 22% respectively. Besides, we observe that we can find the right balance between performance and reliability by using an appropriate cache organization at NTC which is different from the super threshold.
影响因子：
2.2
作者：
Henning, JL
通讯作者：
Henning, JL