The effects of proton irradiation on coolrunner-II - CPID technology
The effects of proton irradiation on coolrunner-II - CPID technology
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质子辐照对 Coolrunner-II 的影响 - CPID 技术
DOI：
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发表时间：
2008
期刊：
影响因子：
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通讯作者：
S. Rodriguez
中科院分区：
文献类型：
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作者：
M. García;M. Portela;C. López;L. Entrena;A. Martín;J. R. de Mingo;M. Álvarez;S. Esteve;S. Rodriguez
目前，复杂可编程器件在航天任务中的需求很高。从这个意义上说，CoolRunner-II设备由于其低功耗而非常有吸引力。然而，迄今为止还没有关于该技术的质子敏感性的报道。在这项工作中，质子辐照测试进行这些设备的能量范围从6至63兆电子伏在静态和动态模式。报告的结果允许考虑这些设备适合空间应用。
Nowadays, Complex Programmable Devices are highly demanded in space missions. In this sense, CoolRunner-II devices are very attractive due to their low-power consumption. However, there is no report on proton sensitivity for this technology until date. In this work proton irradiation tests were performed on these devices in the energy range from 6 to 63 MeV in both static and dynamic modes. The results reported allow considering these devices suitable for space applications.