Global Existence and Relaxation Limit for Smooth Solutions to the Euler-Poisson Model for Semiconductors

Global Existence and Relaxation Limit for Smooth Solutions to the Euler-Poisson Model for Semiconductors
复制标题

DOI:
10.1137/s0036141099355174
复制
发表时间:
2000
期刊:
SIAM J. Math. Anal.
影响因子:
--
通讯作者:
G. Alì;Dario Bini;S. Rionero
G. Alì;Dario Bini;S. Rionero
中科院分区:
其他
文献类型:
--
作者:
G. Alì;Dario Bini;S. Rionero

文献摘要

被引文献

相似文献

We establish the global existence of smooth solutions of the Cauchy problem for the one-dimensional Euler--Poisson model for semiconductors, under the assumption that the initial data are perturbations of a stationary solution of the drift-diffusion equations. The resulting evolutionary solutions converge asymptotically in time to the unperturbed state.