Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1
Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1
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DOI：
10.1063/1.5119155
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发表时间：
2019-11-01
影响因子：
1.6
通讯作者：
Nordlund, Dennis
中科院分区：
文献类型：
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作者：
Lee, Sang-Jun;Titus, Charles J.;Nordlund, Dennis
我们提出了一种新的软X射线光谱仪的基础上过渡边缘传感器（TES）组成的钼/铜双层耦合铋吸收剂。该光谱仪同时提供优异的能量分辨率、高探测效率和宽带光谱覆盖。新的光谱仪是优化的入射X射线能量低于2千电子伏。每个像素既作为一个高灵敏度的量热计和X射线吸收器与近单位量子效率。我们已经委托这240像素TES光谱仪在斯坦福大学同步辐射光源光束线10-1（BL 10-1），并使用它来探测样品材料的局部电子结构在软X射线制度前所未有的灵敏度。安装时，TES光谱仪的最大检测立体角为2 x 10（-3）sr。所有像素组合的能量分辨率为1.5 eV半峰全宽（500 eV）。我们描述的TES光谱仪在其能量分辨率和计数率的能力方面的性能，并证明其实用程序作为一个高通量的检测器同步加速器为基础的X射线光谱。给出了该谱仪的初始X射线发射谱和共振非弹性X射线散射实验结果。由AIP Publishing授权出版。
We present results obtained with a new soft X-ray spectrometer based on transition-edge sensors (TESs) composed of Mo/Cu bilayers coupled to bismuth absorbers. This spectrometer simultaneously provides excellent energy resolution, high detection efficiency, and broadband spectral coverage. The new spectrometer is optimized for incident X-ray energies below 2 keV. Each pixel serves as both a highly sensitive calorimeter and an X-ray absorber with near unity quantum efficiency. We have commissioned this 240-pixel TES spectrometer at the Stanford Synchrotron Radiation Lightsource beamline 10-1 (BL 10-1) and used it to probe the local electronic structure of sample materials with unprecedented sensitivity in the soft X-ray regime. As mounted, the TES spectrometer has a maximum detection solid angle of 2 x 10(-3) sr. The energy resolution of all pixels combined is 1.5 eV full width at half maximum at 500 eV. We describe the performance of the TES spectrometer in terms of its energy resolution and count-rate capability and demonstrate its utility as a high throughput detector for synchrotron-based X-ray spectroscopy. Results from initial X-ray emission spectroscopy and resonant inelastic X-ray scattering experiments obtained with the spectrometer are presented. Published under license by AIP Publishing.