Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers.
Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers.
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DOI：
10.1021/acs.jpclett.6b01096
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发表时间：
2016-08-04
期刊：
影响因子：
--
通讯作者：
Zojer E
中科院分区：
文献类型：
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作者：
Hehn I;Schuster S;Wächter T;Abu-Husein T;Terfort A;Zharnikov M;Zojer E
含有嵌入偶极基团的自组装单分子膜(SAM)具有改变表面电子性质而不影响SAM环境界面的独特优势。在这里，我们表明，这样的系统也可以用来通过生长由嵌入偶极基团的不同取向的分子组成的混合单层来连续调节金属功函数。为了避免在器件中使用SAM修饰电极时出现注入热点，两种组分的均匀混合至关重要。我们表明，高分辨率X射线光电子能谱与最先进的模拟相结合是探测层的静电均一性，从而在分子水平上确定极性吸附组件中的相分离过程的理想工具。
Self-assembled monolayers (SAMs) containing embedded dipolar groups offer the particular advantage of changing the electronic properties of a surface without affecting the SAM–ambient interface. Here we show that such systems can also be used for continuously tuning metal work functions by growing mixed monolayers consisting of molecules with different orientations of the embedded dipolar groups. To avoid injection hot-spots when using the SAM-modified electrodes in devices, a homogeneous mixing of the two components is crucial. We show that a combination of high-resolution X-ray photoelectron spectroscopy with state-of-the-art simulations is an ideal tool for probing the electrostatic homogeneity of the layers and thus for determining phase separation processes in polar adsorbate assemblies down to inhomogeneities at the molecular level.