Variation Aware Analog and Mixed-Signal Circuit Design in Emerging Multi-Gate CMOS Technologies

Variation Aware Analog and Mixed-Signal Circuit Design in Emerging Multi-Gate CMOS Technologies
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新兴多栅极 CMOS 技术中的变化感知模拟和混合信号电路设计

DOI:
10.1007/978-90-481-3280-5
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发表时间:
2009
期刊:
2011 International Reliability Physics Symposium
影响因子:
--
通讯作者:
M. Fulde
M. Fulde
中科院分区:
--
文献类型:
--
作者:
M. Fulde

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由于CMOS的尺度正在达到纳米区域,严重的限制迫使引入新的材料,器件架构和器件概念。采用高k栅电阻的多栅器件被认为是克服传统平面体CMOS的这些缩放限制的有前途的解决方案。《新兴多门CMOS技术中的变化感知模拟和混合信号电路设计》提供了新兴高k和多门CMOS技术中模拟和混合信号电路的技术导向评估。
Since scaling of CMOS is reaching the nanometer area serious limitations enforce the introduction of novel materials, device architectures and device concepts. Multi-gate devices employing high-k gate dielectrics are considered as promising solution overcoming these scaling limitations of conventional planar bulk CMOS. Variation Aware Analog and Mixed-Signal Circuit Design in Emerging Multi-Gate CMOS Technologies provides a technology oriented assessment of analog and mixed-signal circuits in emerging high-k and multi-gate CMOS technologies.