Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy
Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy
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DOI：
10.1016/s0169-4332(00)00050-7
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发表时间：
2000-06
影响因子：
6.7
通讯作者：
J. Ramdani;R. Droopad;Z. Yu;J. Curless;C. Overgaard;J. Finder;K. Eisenbeiser;J. Hallmark;W. Ooms;V. Kaushik;P. Alluri;S. Pietambaram
中科院分区：
文献类型：
--
作者：
J. Ramdani;R. Droopad;Z. Yu;J. Curless;C. Overgaard;J. Finder;K. Eisenbeiser;J. Hallmark;W. Ooms;V. Kaushik;P. Alluri;S. Pietambaram
