Surface Resistance Measurements on Nonceramic Insulators
Surface Resistance Measurements on Nonceramic Insulators
复制标题
非陶瓷绝缘体的表面电阻测量
DOI：
10.1109/mper.2001.4311575
复制
发表时间：
2001
期刊：
影响因子：
--
通讯作者：
H. Schneider
中科院分区：
文献类型：
--
作者：
R. Gorur;H. Schneider
给出了非陶瓷绝缘子(NCI)表面电阻的测量结果和分析。这项研究的目的是确定表面电阻测量程序是否可以规范化，以确保结果的可重复性和再现性。NCIS评估的外壳材料由一种硅橡胶和一种三元乙丙橡胶(EPDM)橡胶制成。以瓷柱绝缘子为参照物。工作队的结论是，有可能在实验室内建立一个表面电阻测量标准。这样的标准很有价值，因为表面电阻提供了：(1)NCI外壳材料老化的指示；(2)与传统的等效盐析出密度(ESDD)测量相比，更灵敏地指示绝缘子上的真实污染严重程度。作为这一方向的第一步，本文提供了测量指南。并对今后的标准化工作提出了建议。
The results and analysis of surface resistance measurements performed on nonceramic insulators (NCI) are presented in this paper. The goal of this study was to determine if the surface resistance measurement procedure can be formalized to ensure repeatable and reproducible results. The NCIs evaluated had housing materials made from one type of silicone rubber and one type of ethylene propylene diene terpolymers (EPDM) rubber. A porcelain post insulator was used as a reference. The Task Force concluded that it is possible to establish a standard for surface resistance measurement in the laboratory. Such a standard is valuable since surface resistance provides: (1) an indication of aging on NCI housing material, and (2) a more sensitive indicator of true contamination severity on insulators than provided by conventional equivalent salt deposit density (ESDD) measurements. As a first step in this direction, guidelines for measurement have been provided in this paper. Suggestions for future work needed for standardization are also included in the paper.