A very low level of magnetic field exposure dose not affect a participant's mental fatigue and stress as much as VDT work

A very low level of magnetic field exposure dose not affect a participant's mental fatigue and stress as much as VDT work
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极低水平的磁场暴露不会像 VDT 工作那样影响参与者的精神疲劳和压力

DOI:
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发表时间:
2005
期刊:
J UOEH 27-1
影响因子:
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通讯作者:
Ishihara I.
Ishihara I.
中科院分区:
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文献类型:
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作者:
蘆田知史;岡本耕太郎;前本篤男;他;今西二郎;Kasai H.;今西二郎;Ishihara I.

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