Sulfur-Doped Black Phosphorus Field-Effect Transistors with Enhanced Stability
Sulfur-Doped Black Phosphorus Field-Effect Transistors with Enhanced Stability
复制标题
具有增强稳定性的掺硫黑磷场效应晶体管
DOI:
10.1021/acsami.7b19169
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发表时间:
2018-03-21
影响因子:
9.5
通讯作者:
Liu, Zhongyuan
中科院分区:
文献类型:
--
作者:
Lv, Weiming;Yang, Bingchao;Liu, Zhongyuan
Black phosphorus (BP) has drawn great attention owing to its tunable band gap depending on thickness, high mobility, and large I-on/I-off Toff ratio, which makes BP attractive for using in future two-dimensional electronic and optoelectronic devices. However, its instability under ambient conditions poses challenge to the research and limits its practical applications. In this work, we present a feasible approach to suppress the degradation of BP by sulfur (5) doping. The fabricated S-doped BP few layer field-effect transistors (FETs) show more stable transistor performance under ambient conditions. After exposing to air for 21 days, the charge-carrier mobility of a representative S-doped BP FETs device decreases from 607 to 470 cm(2) V-1 s(-1) (remained as high as 77.4%) under ambient conditions and a large I-on/I-off ratio of similar to 10(3) is still retained. The atomic force microscopy analysis, including surface morphology, thickness, and roughness, also indicates the lower degradation rate of S-doped BP compared to BP. First-principles calculations show that the dopant S atom energetically prefers to chemisorb on the BP surface in a dangling form and the enhanced stability of S-doped BP can be ascribed to the downshift of the conduction band minimum of BP below the redox potential of O-2/O-2(-). Our work suggests that S doping is an effective way to enhance the stability of black phosphorus.