Study on important diffusion parameters of binary Ni3Sn4 phase

Study on important diffusion parameters of binary Ni3Sn4 phase
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DOI:
10.1007/s10854-013-1133-2
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发表时间:
2013-02
期刊:
Journal of Materials Science: Materials in Electronics
影响因子:
--
通讯作者:
C. Ghosh
C. Ghosh
中科院分区:
其他
文献类型:
--
作者:
C. Ghosh

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借助增量扩散偶技术 (Sn/Ni0.57Sn0.43) 在 200–150 °C 的温度范围内研究了重要的扩散参数,例如抛物线生长常数、积分扩散率、Ni 和 Sn 物质的固有扩散率之比、Kirkendall 标记速度和二元 Ni3Sn4 相扩散动力学的活化能。从阿累尼乌斯图提取的低活化能表明晶界控制的扩散过程。在 200 °C 时,Sn 物质的速度比 Ni 快三倍。此外,Sn示踪剂扩散率的活化能大于Ni的活化能。
Important diffusion parameters, such as—parabolic growth constant, integrated diffusivity, ratio of intrinsic diffusivities of species Ni and Sn, Kirkendall marker velocity and the activation energy for diffusion kinetics of binary Ni3Sn4phase have been investigated with the help of incremental diffusion couple technique (Sn/Ni0.57Sn0.43) in the temperature range 200–150 °C. Low activation energy extracted from Arrhenius plot indicates grain boundary controlled diffusion process. The species Sn is three times faster than Ni at 200 °C. Further, the activation energy of Sn tracer diffusivity is greater than that of Ni.