Characteristics of polarization-doped N-face III-nitride light-emitting diodes
Characteristics of polarization-doped N-face III-nitride light-emitting diodes
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DOI:
10.1063/1.3687181
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发表时间:
2012-02
影响因子:
4
通讯作者:
K. Dong;Dunjun Chen;B. Liu;Hai Lu;Peng Chen;Rong Zhang;Youdou Zheng
中科院分区:
文献类型:
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作者:
K. Dong;Dunjun Chen;B. Liu;Hai Lu;Peng Chen;Rong Zhang;Youdou Zheng
The electrical and optical performances of N-face GaN-based light-emitting diodes (LEDs) with polarization-induced p-type doping are investigated theoretically. In comparison with the polarization-doped metal-face LED, the N-face one exhibits significant improvements in the hole injection efficiency and electroluminescence intensity when the applied forward voltage exceeds a certain value. Simultaneously, a reversed quantum confined Stark effect is observed in the polarization-doped N-face LED. The detailed physical mechanisms are explained in terms of the calculated energy band diagrams, carrier transport, and distribution of electric field containing polarization filed and free-carrier screening field.