Neural networks-based variationally enhanced sampling
Neural networks-based variationally enhanced sampling
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DOI:
10.1073/pnas.1907975116
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发表时间:
2019-09-03
影响因子:
11.1
通讯作者:
Parrinello, Michele
中科院分区:
文献类型:
--
作者:
Bonati, Luigi;Zhang, Yue-Yu;Parrinello, Michele
Sampling complex free-energy surfaces is one of the main challenges of modern atomistic simulation methods. The presence of kinetic bottlenecks in such surfaces often renders a direct approach useless. A popular strategy is to identify a small number of key collective variables and to introduce a bias potential that is able to favor their fluctuations in order to accelerate sampling. Here, we propose to use machine-learning techniques in conjunction with the recent variationally enhanced sampling method [O. Valsson, M. Parrinello, Phys. Rev. Lett. 113, 090601 (2014)] in order to determine such potential. This is achieved by expressing the bias as a neural network. The parameters are determined in a variational learning scheme aimed at minimizing an appropriate functional. This required the development of a more efficient minimization technique. The expressivity of neural networks allows representing rapidly varying free-energy surfaces, removes boundary effects artifacts, and allows several collective variables to be handled.