Pulsed digital holographic interferometry with 694- and 347-nm wavelengths.
Pulsed digital holographic interferometry with 694- and 347-nm wavelengths.
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DOI：
10.1364/ao.39.000246
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发表时间：
2000-01
期刊：
影响因子：
1.9
通讯作者：
G. Pedrini;H. Tiziani;M. Gusev
中科院分区：
文献类型：
--
作者：
G. Pedrini;H. Tiziani;M. Gusev
提出了一种基于数字全息术的变形分析和形状测量方法。使用两个波长，694和347 nm。用这两种波长同时照射物体，并将数字全息图记录在CCD芯片上。对应于两个波长的信息在傅立叶域中分离，并且计算对应于波前的相位。通过同时记录两种不同波长的全息图，我们可以获得不同灵敏度的变形或形状测量。给出了实验结果。
A method for deformation analysis and shape measurement based on digital holography is presented. Two wavelengths, 694 and 347 nm, are used. The object is illuminated with the two wavelengths at the same time, and digital holograms are recorded on a CCD chip. The information corresponding to the two wavelengths is separated in the Fourier domain, and the phase corresponding to the wave fronts is calculated. By recording holograms with two different wavelengths at the same time, we can get measurements of deformations or shape with different sensitivities. Experimental results are presented.