Low temperature magnetic force microscope utilizing a piezoresistive cantilever
Low temperature magnetic force microscope utilizing a piezoresistive cantilever
复制标题
利用压阻悬臂梁的低温磁力显微镜
DOI：
10.1063/1.112103
复制
发表时间：
1994
影响因子：
4
通讯作者：
M. Tortonese
中科院分区：
文献类型：
--
作者：
C. Yuan;E. Batalla;M. Zacher;A. D. Lozanne;M. D. Kirk;M. Tortonese
我们已经开发了一种低温磁力显微镜，能够在真空中使用压阻悬臂在6 K以下工作。我们使用非接触式调频技术来检测铁涂层尖端和样品之间的磁力梯度。我们通过在室温、77和6 K下获得VHS磁带的磁畴图像来演示该仪器的操作。这种显微镜非常适合于高温超导体薄膜的表征。
We have developed a low temperature magnetic force microscope capable of operation down to 6 K in vacuum by using piezoresistive cantilevers. We use the non‐contact frequency modulation technique to detect the magnetic force gradient between an iron‐coated tip and the sample. We demonstrate the operation of this new instrument by obtaining images of magnetic domains in VHS tape at room temperature, 77 and 6 K. This microscope is ideally suited for the characterization of thin films of high temperature superconductors.