64-Pixel linear-array Si-APD detector for X-ray time-resolved experiments
64-Pixel linear-array Si-APD detector for X-ray time-resolved experiments
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用于 X 射线时间分辨实验的 64 像素线性阵列 Si-APD 探测器
DOI：
10.1016/j.nima.2013.06.023
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发表时间：
2013
期刊：
影响因子：
--
通讯作者：
T Taniguchi and M Tanaka
中科院分区：
文献类型：
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作者：
S Kishimoto;H Yonemura;S Adachi;S Shimazaki;M Ikeno;M Saito;T Taniguchi and M Tanaka
我们研制了一种硅雪崩光电二极管（Si-APD）线阵探测器，用于脉冲同步辐射X射线实验中的时间分辨测量。Si-APD线阵由64个100×200 μm2像素组成，像素间距为150 μm，耗尽层深度为10 μm。该器件的纳秒级响应和高计数率对于脉冲同步辐射时间分辨X射线衍射实验具有重要的应用价值。能够在2ns的短间隔内分辨连续X射线脉冲的检测器系统对于在纳秒周期内记录X射线衍射图案的强度和位置将是非常有效的。一个原型探测器系统配备了超快专用集成电路，现场可编程门阵列和网络处理器板制造。在同步加速器X射线束下，它允许每通道> 107 cps的高计数率;然而，时间分辨率仅限于10 ns。探测器通过扫描探测器位置成功记录了小角度X射线散射。
We have developed a silicon avalanche-photodiode (Si-APD) linear array detector to be used for time-resolved measurements in pulsed synchrotron X-ray experiments. The Si-APD linear array consists of 64 pixels 100×200 μm2, with a pixel pitch of 150 μm and a depletion depth of 10 μm. The nanosecond response and high counting rate of the Si-APD are very valuable for time-resolved X-ray diffraction experiments using pulsed synchrotron radiation. A detector system that can resolve successive X-ray pulses within a short interval of 2 ns would be very efficient for recording the intensity and position of X-ray diffraction patterns within a nanosecond period. A prototype detector system equipped with an ultrafast application-specific integrated circuit, field-programmable gate arrays and network processor boards was fabricated. It allowed a high count-rate of >107cps per channel with a synchrotron X-ray beam; however, the time resolution was limited to 10 ns. The detector successfully recorded small-angle X-ray scattering by scanning the detector position.