Stochastic Evaluation and Analysis of Free Vibrations in Simply Supported Piezoelectric Bimorphs
Stochastic Evaluation and Analysis of Free Vibrations in Simply Supported Piezoelectric Bimorphs
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DOI：
10.1115/1.4007721
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发表时间：
2013-03-01
影响因子：
2.6
通讯作者：
Faglia, Rodolfo
中科院分区：
文献类型：
--
作者：
Borboni, Alberto;Faglia, Rodolfo
压电双晶片弯曲器是一类特殊的压电器件，其特征在于能够产生远大于单个压电层的长度或厚度变形的弯曲变形。由于器件尺寸的大幅度减小以及对精度和重复性的高要求，有时不能忽略参数估计错误和外部原因引起的参数波动的影响。因此，我们认为机械，电气和压电参数均匀分布在一个标称值，我们计算的设备的自然频率的分布。我们考虑了文献中提出的压电双晶片的解析模型。结果表明，参数误差是如何反映在固有频率和如何增量的误差是能够改变的形状的频率分布。
Piezoelectric bimorph benders are a particular class of piezoelectric devices, which are characterized by the ability to produce flexural deformation greatly larger than the length or thickness deformation of a single piezoelectric layer. Due to extensive dimensional reduction of devices and to the high accuracy and repeatability requested, the effect of erroneous parameter estimation and the fluctuation of parameters due to external reasons, sometimes, cannot be omitted. As such, we consider mechanical, electrical and piezoelectric parameters as uniformly distributed around a nominal value and we calculate the distribution of natural frequencies of the device. We consider an analytical model for the piezoelectric bimorph proposed in literature. The results show how the parameters errors are reflected on the natural frequencies and how an increment of the error is able to change the shape of the frequencies distribution.