Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance
Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance
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DOI：
10.1088/0957-4484/26/12/125701
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发表时间：
2015-03
期刊：
影响因子：
3.5
通讯作者：
Eiji Arima;Y. Naitoh;Yan Jun Li;S. Yoshimura;H. Saito;H. Nomura;R. Nakatani;Y. Sugawara
中科院分区：
文献类型：
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作者：
Eiji Arima;Y. Naitoh;Yan Jun Li;S. Yoshimura;H. Saito;H. Nomura;R. Nakatani;Y. Sugawara
在磁力显微镜(MFM)中，为了分析高空间分辨率的微观磁畴结构，需要减小针尖-样品之间的距离。然而，由于样品表面诱导的静电力和范德华等相互作用力的叠加，实现较小的尖端-样品距离一直是困难的。在这项研究中，我们提出了一种新的利用铁磁共振(FMR)来提取样品表面附近磁场的MFM方法。在该方法中，通过铁磁共振调制悬臂梁的磁化强度来分离磁场和地形结构。我们演示了悬臂梁磁化强度的调制和垂直磁性介质的极性识别。
In magnetic force microscopy (MFM), the tip–sample distance should be reduced to analyze the microscopic magnetic domain structure with high spatial resolution. However, achieving a small tip–sample distance has been difficult because of superimposition of interaction forces such as van der Waals and electrostatic forces induced by the sample surface. In this study, we propose a new method of MFM using ferromagnetic resonance (FMR) to extract only the magnetic field near the sample surface. In this method, the magnetization of a magnetic cantilever is modulated by FMR to separate the magnetic field and topographic structure. We demonstrate the modulation of the magnetization of the cantilever and the identification of the polarities of a perpendicular magnetic medium.