Spectroscopic metrics allow in situ measurement of mean size and thickness of liquid-exfoliated few-layer graphene nanosheets

Spectroscopic metrics allow in situ measurement of mean size and thickness of liquid-exfoliated few-layer graphene nanosheets
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DOI:
10.1039/c5nr08047a
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发表时间:
2016-01-01
期刊:
影响因子:
6.7
通讯作者:
Coleman, Jonathan N.
Coleman, Jonathan N.
中科院分区:
材料科学2区
文献类型:
--
作者:
Backes, Claudia;Paton, Keith R.;Coleman, Jonathan N.

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