Strong molecular alignment dependence of H2 electron impact ionization dynamics.
Strong molecular alignment dependence of H2 electron impact ionization dynamics.
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DOI：
10.1103/physrevlett.109.123202
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发表时间：
2012-09
影响因子：
8.6
通讯作者：
X. Ren;T. Pflüger;Shenyue Xu;J. Colgan;M. Pindzola;A. Senftleben;J. Ullrich;A. Dorn
中科院分区：
文献类型：
--
作者：
X. Ren;T. Pflüger;Shenyue Xu;J. Colgan;M. Pindzola;A. Senftleben;J. Ullrich;A. Dorn
已经研究了分子氢（H（2））的低能量（E（0）= 54 eV）电子碰撞单电离作为分子排列的函数，以基准最近的理论预测[Colgan等人，物理学评论快报101，233201（2008）和Al-Hagan等人，5，59（2009）]。在任何以前的工作相比，我们观察到不同的取向依赖的（E，2 E）在垂直平面的横截面在良好的整体协议与时间相关的紧密耦合计算的结果。横截面的行为可以一致地解释为在分子势中的喷射电子的重新散射导致沿分子轴沿着的有效聚焦。
Low-energy (E(0) = 54 eV) electron impact single ionization of molecular hydrogen (H(2)) has been investigated as a function of molecular alignment in order to benchmark recent theoretical predictions [Colgan et al., Phys. Rev. Lett. 101, 233201 (2008) and Al-Hagan et al., Nature Phys. 5, 59 (2009)]. In contrast to any previous work, we observe distinct alignment dependence of the (e,2e) cross sections in the perpendicular plane in good overall agreement with results from time-dependent close-coupling calculations. The cross section behavior can be consistently explained by a rescattering of the ejected electron in the molecular potential resulting in an effective focusing along the molecular axis.