Introduction to Conventional Transmission Electron Microscopy: Defects in crystals
Introduction to Conventional Transmission Electron Microscopy: Defects in crystals
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DOI：
10.1017/cbo9780511615092.010
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发表时间：
2003-04
期刊：
影响因子：
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通讯作者：
M. Graef
中科院分区：
文献类型：
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作者：
M. Graef
这本 2003 年出版的书涵盖了应用于晶体固体的传统透射电子显微镜 (CTEM) 的基础知识。重点是用于量化和分析 CTEM 观测结果的实验和计算方法。文本附带一个包含交互模块和免费 Fortran 源代码的补充网站。本书从晶体学和量子力学的基础知识开始，为本书的其余部分提供了坚实的数学基础。下一节讨论显微镜本身，根据基本理论描述各个组件。本书的后半部分重点介绍固体中电子散射的动力学理论，包括其在完美和有缺陷的晶体、电子衍射和相衬技术中的应用。本书基于作者在卡内基梅隆大学材料科学与工程系讲授的课程，非常适合研究生以及刚进入该领域的研究人员。
This 2003 book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.