Focal plane alignment and detector characterization for the Subaru prime focus spectrograph

Focal plane alignment and detector characterization for the Subaru prime focus spectrograph
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Subaru 主焦点光谱仪的焦平面对准和探测器表征

DOI:
10.1117/12.2057558
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发表时间:
2014
期刊:
--
影响因子:
--
通讯作者:
S. Smee
S. Smee
中科院分区:
--
文献类型:
--
作者:
M. Hart;R. Barkhouser;M. Carr;M. Golebiowski;J. Gunn;S. Hope;S. Smee

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我们描述了正在开发的基础设施,以对准和表征斯巴鲁测量图像和红移(SuMIRe)主聚焦光谱仪(PFS)的探测器。PFS将使用四个三通道光谱仪,工作波长范围为3800°A至12600°A。每个光谱仪将由两个可见光通道和一个近红外(NIR)通道组成,每个通道将使用单独的施密特相机将捕获的光谱成像到各自的探测器上。在可见光通道中,滨松2k×4k ccd将成对安装,以创建单个4k×4k探测器,而近红外通道将使用单个Teledyne 4k×4k H4RG HgCdTe器件。施密特相机的快速f/1.1光学系统将提供较浅的焦深,这就需要优化焦平面阵列的平面度。可见光通道的焦平面阵列平坦度的最小偏差由ccd平坦度设置,通常为10μm峰谷。我们将调整一对ccd的共面性,以使阵列的平坦度与探测器本身的平坦度一致。为了实现这一点,我们将使用光学非接触测量系统来测量环境温度和工作温度下的表面平坦度和共面度,并使用垫片来调整CCD的共面度。我们将使PFS探测器的性能与该项目的科学目标保持一致。为此,我们将测量这些器件的增益、线性度、全势垒、量子效率(QE)、电荷扩散、电荷转移效率(CTI)和噪声特性。我们还希望更好地了解CCDS的光子传输曲线的非线性,以及HgCdTe器件的电荷持久性/互易问题。为了能够对这些探测器进行测量和表征,我们正在建造两个设计上几乎相同的测试低温恒温器。第一个测试低温恒温器将主要用于共面性测量和亚像素照明测试,第二个测试将专门用于现场照明所需的性能表征。在本文中,我们将描述测试低温恒温器的设计。我们还将描述我们建立的用于测量焦平面阵列平面度的系统,并检查其操作的精度和误差。最后,我们将详细介绍我们计划用来表征PFS探测器性能的方法,并提供初步结果。
We describe the infrastructure being developed to align and characterize the detectors for the Subaru Measure- ment of Images and Redshifts (SuMIRe) Prime Focus Spectrograph (PFS). PFS will employ four three-channel spectrographs with an operating wavelength range of 3800 °A to 12600 °A. Each spectrograph will be comprised of two visible channels and one near infrared (NIR) channel, where each channel will use a separate Schmidt camera to image the captured spectra onto their respective detectors. In the visible channels, Hamamatsu 2k × 4k CCDs will be mounted in pairs to create a single 4k × 4k detector, while the NIR channel will use a single Teledyne 4k × 4k H4RG HgCdTe device. The fast f/1.1 optics of the Schmidt cameras will give a shallow depth of focus necessitating an optimization of the focal plane array flatness. The minimum departure from flatness of the focal plane array for the visible channels is set the by the CCD flatness, typically 10 μm peak-to-valley. We will adjust the coplanarity for a pair of CCDs such that the flatness of the array is consistent with the flatness of the detectors themselves. To achieve this we will use an optical non-contact measurement system to measure surface flatness and coplanarity at both ambient and operating temperatures, and use shims to adjust the coplanarity of the CCDs. We will characterize the performance of the detectors for PFS consistent with the scientific goals for the project. To this end we will measure the gain, linearity, full well, quantum efficiency (QE), charge diffusion, charge transfer inefficiency (CTI), and noise properties of these devices. We also desire to better understand the non-linearity of the photon transfer curve for the CCDs, and the charge persistence/reciprocity problems of the HgCdTe devices. To enable the metrology and characterization of these detectors we are building two test cryostats nearly identical in design. The first test cryostat will primarily be used for the coplanarity measurements and sub- pixel illumination testing, and the second will be dedicated to performance characterization requiring at field illumination. In this paper we will describe the design of the test cryostats. We will also describe the system we have built for measuring focal plane array flatness, and examine the precision and error with which it operates. Finally we will detail the methods by which we plan to characterize the performance of the detectors for PFS, and provide preliminary results.
DOI: --
发表时间: 2006
期刊: Proceedings of the SPIE S High Energy, Optical, and Infrared Detectors for Astronomy II. 6276
影响因子: --
作者:
鎌田有紀子
通讯作者: 鎌田有紀子