Relationship between magnetoresistance and lattice uncertainty at the interface in sputtered Fe/Cr multilayer films
Relationship between magnetoresistance and lattice uncertainty at the interface in sputtered Fe/Cr multilayer films
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DOI：
10.1143/jpsj.61.1169
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发表时间：
1992-04
影响因子：
1.7
通讯作者：
K. Takanashi;Y. Obi;Y. Mitani;H. Fujimori
中科院分区：
文献类型：
--
作者：
K. Takanashi;Y. Obi;Y. Mitani;H. Fujimori
我们研究了射频溅射制备的Fe/Cr多层膜中磁阻与界面处晶面间距的类晶无序之间的关系。利用修正的类晶理论分析了（110）和（220）峰的X射线线宽，以获得晶粒尺寸和代表类晶无序程度的晶格不确定性。我们发现磁阻随着晶格不确定性的降低而增加。
We have investigated the relationship between the magnetoresistance and the paracrystalline disorder of lattice plane spacings at the interface in Fe/Cr multilayer films prepared by rf sputtering. The X-ray linewidths for the (110) and (220) peaks were analysed using a modified paracrystalline theory to obtain the grain size and the lattice uncertainty, which represents the degree of paracrystalline disorder. We have found that the magnetoresistance increases with decreasing lattice uncertainty.