XMIPP:: a new generation of an open-source image processing package for electron microscopy

XMIPP:: a new generation of an open-source image processing package for electron microscopy
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DOI:
10.1016/j.jsb.2004.06.006
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发表时间:
2004-11-01
影响因子:
3
通讯作者:
Pascual-Montano, A
Pascual-Montano, A
中科院分区:
生物学3区
文献类型:
--
作者:
Sorzano, COS;Marabini, R;Pascual-Montano, A

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基于X-windows的显微图像处理软件包(XMIPP)是一套专门的图像处理程序,主要用于从透射电子显微镜获得的大量投影图像中获得生物样品的三维重建。这个公共领域的软件包在八年前被引入电子显微镜领域,从那时起,它发生了巨大的变化。单粒子投影图像分析的新方法已被添加到分类,对比度传递函数校正,角度分配,3D重建,晶体重建等。此外,该软件包已扩展了2D晶体和电子断层扫描数据的功能。此外,它目前在C++中的实现,具有高度模块化的设计,具有良好的文档数据结构和功能,为开发新算法提供了一个方便的环境。在本文中,我们提出了一个新一代的Xmipp,已重新设计,以最大限度地提高灵活性和模块化,有可能促进其集成在未来的标准化工作在该领域的一般概述。此外,通过专注于这些发展,区分Xmipp从其他软件包,我们说明了它的附加值的电子显微镜社区。(C)2004年爱思唯尔公司All rights reserved.
X-windows based microscopy image processing package (Xmipp) is a specialized suit of image processing programs, primarily aimed at obtaining the 3D reconstruction of biological specimens from large sets of projection images acquired by transmission electron microscopy. This public-domain software package was introduced to the electron microscopy field eight years ago, and since then it has changed drastically. New methodologies for the analysis of single-particle projection images have been added to classification, contrast transfer function correction, angular assignment, 3D reconstruction, reconstruction of crystals, etc. In addition, the package has been extended with functionalities for 2D crystal and electron tomography data. Furthermore, its current implementation in C++, with a highly modular design of well-documented data structures and functions, offers a convenient environment for the development of novel algorithms. In this paper, we present a general overview of a new generation of Xmipp that has been re-engineered to maximize flexibility and modularity, potentially facilitating its integration in future standardization efforts in the field. Moreover, by focusing on those developments that distinguish Xmipp from other packages available, we illustrate its added value to the electron microscopy community. (C) 2004 Elsevier Inc. All rights reserved.