High Breakdown-Voltage (>2200 V) AlGaN-Channel HEMTs With Ohmic/Schottky Hybrid Drains
High Breakdown-Voltage (>2200 V) AlGaN-Channel HEMTs With Ohmic/Schottky Hybrid Drains
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DOI:
10.1109/jeds.2018.2864720
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发表时间:
2018
影响因子:
2.3
通讯作者:
Weihang Zhang;Jincheng Zhang;Ming Xiao;Li Zhang;Y. Hao
中科院分区:
文献类型:
--
作者:
Weihang Zhang;Jincheng Zhang;Ming Xiao;Li Zhang;Y. Hao
In this paper, a high breakdown voltage of more than 2200 V in high-electron-mobility transistors (HEMTs) with AlGaN channel and a novel ohmic/Schottky-hybrid drain contact is achieved, which is the record breakdown voltage ever achieved on AlGaN-channel HEMTs. The fabricated device exhibits a high on/off ratio of $7\times 10^{9}$ and a low subthreshold swing of 64 mV/decade, enabled by the AlGaN channel and wet treatment. Furthermore, it exhibits excellent high-temperature output characteristics and dynamic ${I} _{D}$ – ${V} _{D}$ characteristics. Even though both the AlGaN channel and the ohmic/Schottky-hybrid drain have certain impact on the on-state resistance because of the higher sheet resistance and drain contact resistance, these results indicate the significance and potential of AlGaN-channel HEMTs with a hybrid drain architecture in high-voltage applications.