Cloaked Near-Field Scanning Optical Microscope Tip for Noninvasive Near-Field Imaging

Cloaked Near-Field Scanning Optical Microscope Tip for Noninvasive Near-Field Imaging
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DOI:
10.1103/physrevlett.105.263906
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发表时间:
2010-12-29
影响因子:
8.6
通讯作者:
Engheta, Nader
Engheta, Nader
中科院分区:
物理与天体物理1区
文献类型:
--
作者:
Alu, Andrea;Engheta, Nader

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近场成像是生物医学测量中的一种成熟技术,因为更接近于感兴趣的细节,可以解析亚波长细节,否则无法通过常规透镜解析。近场扫描光学显微镜(NSOM)尖端确实可以克服远场光学的分辨率限制,但其接近性固有地干扰测量。在这里,我们应用最近的概念,一个“隐形传感器”的NSOM设备在收集模式,理论上显示如何适当的等离子体覆盖应用到NSOM尖端可能会大大提高其整体测量能力。
Near-field imaging is a well-established technique in biomedical measurements, since closer to the detail of interest it is possible to resolve subwavelength details otherwise unresolved by regular lenses. A near-field scanning optical microscope (NSOM) tip may indeed overcome the resolution limits of far-field optics, but its proximity inherently perturbs the measurement. Here, we apply the recent concept of a "cloaked sensor" to an NSOM device in collection mode, showing theoretically how a proper plasmonic cover applied to an NSOM tip may drastically improve its overall measurement capabilities.