X-ray interferometry: ultra-high-resolution astronomy
X-ray interferometry: ultra-high-resolution astronomy
复制标题
X射线干涉测量：超高分辨率天文学
DOI：
10.1117/12.450952
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发表时间：
2001
影响因子：
1
通讯作者：
R. McEntaffer
中科院分区：
文献类型：
--
作者：
W. Cash;A. Shipley;R. McEntaffer
X射线在以最高角分辨率成像方面具有巨大的潜力。许多x射线源的高表面亮度将揭示迄今为止被认为是无法达到的角度尺度。短波长使仪器紧凑，基线短。我们将讨论如何使用现有技术为天文学建立实用的x射线干涉仪。我们描述的马克西姆探路者和马克西姆任务，将实现100和0.1微弧秒成像。将概述将以高达HST的100万倍的分辨率处理的科学，重点是最终成像黑洞的事件视界。
X-rays have tremendous potential for imaging at the highest angular resolution. The high surface brightness of many x-ray sources will reveal angular scales heretofore thought unreachable. The short wavelengths make instrumentation compact and baselines short. We discuss how practical x-ray interferometers can be built for astronomy using existing technology. We describe the Maxim Pathfinder and Maxim missions which will achieve 100 and 0.1 micro-arcsecond imaging respectively. The science to be tackled with resolution of up to one million times that of HST will be outlined, with emphasis on eventually imaging the event horizon of a black hole.